Published: 2026-04-15

KMP E3502 NEGATIVE PHOTORESIST FILMS ON SILICON

S. ABRAMOV, D. BRINKEVICH, V. PROSOLOVICH, S. VABISHCHEVICH, O. ZUBOVA, I. KONDRUS

21-26

FTIR SPECTROSCOPY OF KMP E3502 NEGATIVE PHOTORESIST FILMS ON MONOCRYSTALLINE SILICON

D. BRINKEVICH, V. PROSOLOVICH, S. VABISHCHEVICH, O. ZUBOVA, I. VLASENKO

27-33

MICROWAVE TECHNOLOGY FOR COMPARATIVE IDENTIFICATION OF MATERIALS

A. GUSINSKIY, M. TUMILOVICH, N. PEVNEVA, V. RODIONOVA, V. SHUTOVICH, O. TANANA

34-39

MODELING OF A HIGH-Q BICONICAL MEASURING RESONATOR

A. GUSINSKIY, M. TUMILOVICH, N. PEVNEVA, V. RODIONOVA, V. SHUTOVICH, O. TANANA

40-46